TOTAL-DOSE RADIATION AND ANNEALING STUDIES: IMPLICATIONS FOR HARDNESS ASSURANCE TESTING.

IEEE Transactions on Nuclear Science

Volumn NS-33, Issue 6, 1986, Pages

  Winokur, P S ^a   Sexton, F W ^a   Schwank, J R ^a   Fleetwood, D M ^a   Dressendorfer, P V ^a   Wrobel, T F ^a   Turpin, D C ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICE TESTING - RADIATION EFFECTS;

HARDNESS ASSURANCE; TOTAL-DOSE RADIATION HARDNESS;

SEMICONDUCTOR DEVICES, MOS;

EID: 0022902409     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (16)