-
1
-
-
0021974614
-
Image Reversal of Positive Photoresist. A New Tool for Advancing Integrated Circuit Fabrication
-
Ailing, E. and Stauffer, C., "Image Reversal of Positive Photoresist. A New Tool for Advancing Integrated Circuit Fabrication, " Proc. SPIE Conf. Advances in Resist Technology and Processing II, Vol. 539, pp. 194-218. 1985.
-
(1985)
Proc. SPIE Conf. Advances in Resist Technology and Processing II
, vol.539
, pp. 194-218
-
-
Ailing, E.1
Stauffer, C.2
-
3
-
-
0004093537
-
Introduction to Microlithography - Theory, Materials and Processing
-
American Chemical Society: Washington, D.C
-
Thompson, L. F., Willson, C. G., and Bowden, M. J., Introduction to Microlithography - Theory, Materials and Processing, ACS Symposium Series 219, American Chemical Society: Washington, D.C., pp. 100-112. 1983.
-
(1983)
ACS Symposium Series 219
, pp. 100-112
-
-
Thompson, L.F.1
Willson, C.G.2
Bowden, M.J.3
-
4
-
-
0018294588
-
Photochemical Decomposition Mechanisms for AZ-Type Photoresists
-
Jan
-
Pacansky, J. and Lyerla, J. R., "Photochemical Decomposition Mechanisms for AZ-Type Photoresists, " IBM J. Res. Develop., Vol. 23(1), pp. 42-55. Jan. 1979.
-
(1979)
IBM J. Res. Develop.
, vol.23
, Issue.1
, pp. 42-55
-
-
Pacansky, J.1
Lyerla, J.R.2
-
5
-
-
0016529979
-
Modeling Projection Printing of Positive Photoresists
-
July
-
Dill, F. H., Neureuther, A. R., Tuttle, J. A., and Walker, E. J., "Modeling Projection Printing of Positive Photoresists, " IEEE Trans. Electron Devices, Vol. 159 (7), pp. 456-464. July 1975.
-
(1975)
IEEE Trans. Electron Devices
, vol.159
, Issue.7
, pp. 456-464
-
-
Dill, F.H.1
Neureuther, A.R.2
Tuttle, J.A.3
Walker, E.J.4
-
6
-
-
0018457024
-
A General Simulator for VLSI Lithography and Etching Processes: Part I - Application to Projection lithography
-
April
-
Oldham, W. G., Nandgaonkar, S.N.A.R.N. and O’Toole, M. "A General Simulator for VLSI Lithography and Etching Processes: Part I - Application to Projection lithography, " IEEE Trans. Electron Devices, Vol. 163(4), pp. 717-722. April 1979.
-
(1979)
IEEE Trans. Electron Devices
, vol.163
, Issue.4
, pp. 717-722
-
-
Oldham, W.G.1
Nandgaonkar, S.2
O’Toole, M.3
-
7
-
-
84957482121
-
Characterization and Modeling of a Resist with Built-in Induction Effect
-
October
-
Kim, D. J., Oldham, W. G., and Neureuther, A. R., "Characterization and Modeling of a Resist with Built-in Induction Effect, " Proc. Kodak Microelectronics Seminar, San Diego. October 1983.
-
(1983)
Proc. Kodak Microelectronics Seminar, San Diego
-
-
Kim, D.J.1
Oldham, W.G.2
Neureuther, A.R.3
-
8
-
-
0020242348
-
Characterization ofthe 'Induction Effect' at Mid-Ultraviolet Exposure: Application to AZ2400 at 313 nm
-
March
-
Hofer, D. C., Willson, C. G., Neureuther, A. R., and Hakey, M., "Characterization ofthe 'Induction Effect' at Mid-Ultraviolet Exposure: Application to AZ2400 at 313 nm, " SPIE Conf. Proc. Optical Microlithography - Technology for the Mid-1980's, vol. 334, pp. 196-205. March 1982.
-
(1982)
SPIE Conf. Proc. Optical Microlithography - Technology for the Mid-1980'S
, vol.334
, pp. 196-205
-
-
Hofer, D.C.1
Willson, C.G.2
Neureuther, A.R.3
Hakey, M.4
-
9
-
-
0016528413
-
Optical Lithography
-
July
-
Dill, F. H., "Optical Lithography, " IEEE Trans. Electron Devices, Vol. 159(7), pp. 440-444 (July 1975).
-
(1975)
IEEE Trans. Electron Devices
, vol.159
, Issue.7
, pp. 440-444
-
-
Dill, F.H.1
-
10
-
-
84912633288
-
Characterization of Resist Development: Models, Equipment, Method and Experimental Results
-
Interface 1982, San Diego, October
-
Kim, D. J., Oldham, W. G., and Neureuther, A. R. "Characterization of Resist Development: Models, Equipment, Method and Experimental Results, " Proc. Kodak Microelectronics Seminar, Interface 1982, San Diego. October 1982.
-
(1982)
Proc. Kodak Microelectronics Seminar
-
-
Kim, D.J.1
Oldham, W.G.2
Neureuther, A.R.3
-
11
-
-
84956232825
-
Effects of Developer Composition on Photo resist Performance
-
Interface 1983, San Diego
-
Hinsberg, W. D. and Gutierrez, M. L., "Effects of Developer Composition on Photo resist Performance, " Proc. Kodak Microelectronics Seminar, Interface 1983, San Diego. 1983.
-
(1983)
Proc. Kodak Microelectronics Seminar
-
-
Hinsberg, W.D.1
Gutierrez, M.L.2
-
12
-
-
60849121256
-
Basis for Processing Differences Between Positive Photoresist Developers: Quaternary Ammonium Hydroxide and Alkali Hydroxide
-
Interface 1985, San Diego. November
-
Arcus, R. A., "Basis for Processing Differences Between Positive Photoresist Developers: Quaternary Ammonium Hydroxide and Alkali Hydroxide, " Proc. Kodak Microelectronics Seminar, Interface 1985, San Diego. November 1985.
-
(1985)
Proc. Kodak Microelectronics Seminar
-
-
Arcus, R.A.1
-
13
-
-
84958519113
-
Metal-ion Free vs Metal-ion Based Developer Solutions (Variations in Processing)
-
Interface 1982, San Diego. October
-
Johnson, A., "Metal-ion Free vs Metal-ion Based Developer Solutions (Variations in Processing), " Proc. Kodak Microelectronics Seminar, Interface 1982, San Diego. October 1982.
-
(1982)
Proc. Kodak Microelectronics Seminar
-
-
Johnson, A.1
-
14
-
-
84957517009
-
Improving Linewidth Control Over Reflective Surfaces Using Heavily Dyed Resists
-
San Diego. November
-
Pampalone, T. and Kuyan, F., "Improving Linewidth Control Over Reflective Surfaces Using Heavily Dyed Resists, " Proc. Kodak Microelectronics Seminar, Interface 1985, San Diego. November 1985.
-
(1985)
Proc. Kodak Microelectronics Seminar, Interface 1985
-
-
Pampalone, T.1
Kuyan, F.2
-
15
-
-
0019035283
-
Single-Step Optical Lift-Off Process
-
July
-
Hatzakis, M., Canavello, B. J., and Shaw, J. M., "Single-Step Optical Lift-Off Process, " IBM J. Res. Develop., Vol. 24(4), pp. 452-460. July 1980.
-
(1980)
IBM J. Res. Develop
, vol.24
, Issue.4
, pp. 452-460
-
-
Hatzakis, M.1
Canavello, B.J.2
Shaw, J.M.3
-
17
-
-
0001315034
-
Velocity of Dissolution of Polymers, Part I
-
Ueberreiter, K. and Asmussen, F., "Velocity of Dissolution of Polymers, Part I, " J. Polym. Sci., Vol. 57, pp. 187-198. 1962.
-
(1962)
J. Polym. Sci.
, vol.57
, pp. 187-198
-
-
Ueberreiter, K.1
Asmussen, F.2
-
18
-
-
0021698239
-
Dependence of Dissolution Rate on Processing and Molecular Parameters of Resists
-
Polymers in Electronics, T. Davidson, ed., ACS: Washington, D.C
-
Ouano, A. C., "Dependence of Dissolution Rate on Processing and Molecular Parameters of Resists, " ACS Symposium Series, Vol. 242, Polymers in Electronics, T. Davidson, ed., ACS: Washington, D.C., pp. 79-90. 1984.
-
(1984)
ACS Symposium Series
, vol.242
, pp. 79-90
-
-
Ouano, A.C.1
-
19
-
-
0022284675
-
High-Tg Base-Soluble Copolymers as Novolac Replacements for Positive Photoresists
-
Ellenville New York, October
-
Turner, S. R., Arcus, R. A., Houle, C. H., and Schleigh, W. R., "High-Tg Base-Soluble Copolymers as Novolac Replacements for Positive Photoresists, " SPE Technical Conference Proc. - Photopolymer Principles - Processes and Materials Vol. 35, Ellenville New York, pp. 34-47. October 1985.
-
(1985)
SPE Technical Conference Proc. Photopolymer Principles - Processes and Materials
, vol.35
, pp. 34-47
-
-
Turner, S.R.1
Arcus, R.A.2
Houle, C.H.3
Schleigh, W.R.4
-
20
-
-
0021934875
-
Use of Quartz Crystal Microbalance Rate Monitor to Examine Photoproduct Effects of Resist Dissolution
-
Hinsberg, W. D., Willson, C. G., and Kanazawa, K. K., "Use of Quartz Crystal Microbalance Rate Monitor to Examine Photoproduct Effects of Resist Dissolution, "SPIE Advances in Resist Technology and Processing II, Vol. 539, pp. 6-13. 1985.
-
(1985)
SPIE Advances in Resist Technology and Processing II
, vol.539
, pp. 6-13
-
-
Hinsberg, W.D.1
Willson, C.G.2
Kanazawa, K.K.3
-
21
-
-
0022093774
-
Effects of Molecular Weight and Plasticization on Dissolution Rates of Thin Polymer Films
-
Cooper, W. J., Krasicky, P. D., and Rodriguez, F., "Effects of Molecular Weight and Plasticization on Dissolution Rates of Thin Polymer Films, " Polymer, Vol. 26, pp. 1069-1072. July 1985.
-
(1985)
Polymer
, vol.26
, pp. 1069-1072
-
-
Cooper, W.J.1
Krasicky, P.D.2
Rodriguez, F.3
-
22
-
-
0021446349
-
Novolac Resins Used in Positive Resist Systems
-
Pampalone, T. R., "Novolac Resins Used in Positive Resist Systems, "Solid State Technology, Vol. 27, pp. 115-120. June 1984.
-
(1984)
Solid State Technology
, vol.27
, pp. 115-120
-
-
Pampalone, T.R.1
-
24
-
-
0016523047
-
Reduction of Photoresist Standing-Wave Effects by Post-exposure Bake
-
Walker, E. J., "Reduction of Photoresist Standing-Wave Effects by Post-exposure Bake, " IEEE Trans. Electron Devices, Vol. 169, pp. 464-466. 1975.
-
(1975)
IEEE Trans. Electron Devices
, vol.169
, pp. 464-466
-
-
Walker, E.J.1
-
25
-
-
0017490398
-
Thermal Effects on the Photoresist AZ1350J
-
May
-
Dill, F. H. and Shaw, J. M., "Thermal Effects on the Photoresist AZ1350J, " IBM J. Res. Dev., Vol. 21, pp. 210-218. May 1977.
-
(1977)
IBM J. Res. Dev
, vol.21
, pp. 210-218
-
-
Dill, F.H.1
Shaw, J.M.2
-
26
-
-
84957483121
-
Resist Development with Ammonium or Phosphonium Compounds and Method of Use to Develop o-Quinone Diazide and Novolac Resist
-
Guild, J., "Resist Development with Ammonium or Phosphonium Compounds and Method of Use to Develop o-Quinone Diazide and Novolac Resist, " U.S. Patent 4, 423, 138, to Eastman Kodak Company.
-
U.S. Patent 4, 423, 138, to Eastman Kodak Company
-
-
Guild, J.1
-
27
-
-
0022066737
-
Dissolution Rate Measurements
-
May
-
Rodriguez, F., Krasicky, P. D., and Groele, R. J., Dissolution Rate Measurements, Solid State Technology, Vol. 28, pp. 125-131. May 1985.
-
(1985)
Solid State Technology
, vol.28
, pp. 125-131
-
-
Rodriguez, F.1
Krasicky, P.D.2
Groele, R.J.3
-
28
-
-
84957531961
-
Photoresist Characterization Using Inter-ferometry During Development
-
San Jose, California, May
-
Grindie, S. P. and Pavelchek, E. K., "Photoresist Characterization Using Inter-ferometry During Development, " Proc. 4th Annual Test and Measurement World Expo., Vol. 2, San Jose, California, pp. 676-693. May 14-16, 1985.
-
(1985)
Proc. 4Th Annual Test and Measurement World Expo
, vol.2
, pp. 676-693
-
-
Grindie, S.P.1
Pavelchek, E.K.2
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