Investigation of Cr segregation within rf-sputtered CoCr films

Journal of Magnetism and Magnetic Materials

Volumn 62, Issue 2-3, 1986, Pages 359-366

  Chapman, J N ^a   McFadyen, I R ^a   Bernards, J P C ^a,b  

^a Department of Natural Philosophy University of Glasgow Glasgow G12 UK ^*

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPIC EXAMINATION - TRANSMISSION ELECTRON MICROSCOPY; SPUTTERING; X-RAY ANALYSIS;

SEGREGATION;

COBALT CHROMIUM ALLOYS;

EID: 0022888289     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-8853(86)90166-6     Document Type: Article

References (14)

1. Recent Magnetics for Electronics
2. Recent Magnetics for Electronics
3. Magnetic properties and microstructure of CoCr based vertical recording materials prepared by ion beam sputtering
4. Microstructure of CoCr Thin Films Prepared by Sputtering
5. Understanding thin film X-ray spectra
6. Elemental segregation and mechanism of sputtering in rf-sputtered Co-Cr films
7. Surface segregation in binary solid solutions: A theoretical and experimental perspective