RANDOM PATTERN TESTABILITY OF DELAY FAULTS.

Digest of Papers - International Test Conference

Volumn , Issue , 1986, Pages 263-273

  Savir, J ^a   McAnney, W H ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

STATISTICAL METHODS;

DELAY TESTING; MARKOV CHAIN; TESTABILITY; TRANSITION MATRIX;

LOGIC CIRCUITS, COMBINATORIAL;

EID: 0022880990     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)