CMOS CIRCUIT DESIGN FOR PREVENTION OF SINGLE EVENT UPSET.

Volumn , Issue , 1986, Pages 385-387

  Kang, S M ^a   Chu, D ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LOGIC CIRCUITS, COMBINATORIAL;

CMOS VLSI; COMBINATIONAL LOGIC; SINGLE EVENT UPSET (SEU);

INTEGRATED CIRCUITS;

EID: 0022876515     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)