CIRCUITS FOR PSEUDO-EXHAUSTIVE TEST PATTERN GENERATION.

Digest of Papers - International Test Conference

Volumn , Issue , 1986, Pages 25-37

  Wang, Laung Terng ^a   McCluskey, Edward J ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTERS, DIGITAL - SHIFT REGISTERS;

AUTONOMOUS TEST; CYCLIC CODES; DIGITAL SYSTEM TESTING; LINEAR FEEDBACK SHIFT REGISTERS (LFSRS); PSEUDO-EXHAUSTIVE SELF-TESTING;

LOGIC CIRCUITS, COMBINATORIAL;

EID: 0022875084     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (30)