IMPROVED RELIABILITY IN AMORPHOUS SILICON THIN FILM TRANSISTOR.

Conference on Solid State Devices and Materials

Volumn , Issue , 1986, Pages 699-702

  Kaneko, Y ^a   Sasano, A ^a   Tsukada, T ^a   Oritsuki, R ^a   Suzuki, K ^a  

^a HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTING SILICON - AMORPHOUS;

DEPOSITION TEMPERATURE; IMPROVED RELIABILITY; LCD PANELS; LIFESPANS; NEGATIVE VOLTAGE STRESS; THRESHOLD VOLTAGE SHIFTS;

TRANSISTORS, FIELD EFFECT;

EID: 0022873630     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)