Row/Column Replacement for the Control of Hard Defects in Semiconductor RAM's

IEEE Transactions on Computers

Volumn C-35, Issue 11, 1986, Pages 996-1000

  Fuja, Tom ^a   Heegard, Chris ^a  

^a Department of Obstetrics Gynecology   (United States)

Author keywords

Error control coding; hard defects; RAM's; redundancy; reliability; row column replacement; yield improvement

Indexed keywords

DATA STORAGE, SEMICONDUCTOR - STORAGE DEVICES;

HARD DEFECTS; RANDOM-ACCESS MEMORIES; ROW/COLUMN REPLACEMENT; SEMICONDUCTOR MEMORIES;

DATA STORAGE, DIGITAL;

EID: 0022812049     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.1986.1676701     Document Type: Article

References (13)

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