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Volumn 28, Issue 4, 1986, Pages 283-291

Testing in industrial experiments with ordered categorical data

Author keywords

Accumulation analysis; ANOVA; Dispersion; Location; Ordered Categories; Scoring methods

Indexed keywords

QUALITY CONTROL; SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0022808036     PISSN: 00401706     EISSN: 15372723     Source Type: Journal    
DOI: 10.1080/00401706.1986.10488143     Document Type: Article
Times cited : (98)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.