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Volumn 251, Issue 2, 1986, Pages 313-320
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Systematic measurements of pulse height defects for heavy ions in surface-barrier detectors
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC FIELDS;
IONS - MEASUREMENTS;
PULSE HEIGHT DEFECT;
RECOMBINATION MODEL;
SILICON-SURFACE-BARRIER DETECTORS;
PARTICLE DETECTORS;
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EID: 0022793159
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/0168-9002(86)90796-5 Document Type: Article |
Times cited : (65)
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References (20)
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