Dynamic Testing and Diagnostics of A/D Converters

IEEE Transactions on Circuits and Systems

Volumn 33, Issue 8, 1986, Pages 775-785

  Bossche, M Vanden ^a   Schoukens, J ^a   Renneboog, J ^a  

^a VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL TRANSFORMATIONS;

INTEGRAL AND DIFFERENTIAL LINEARITY; SINEWAVE WITH UNKNOWN AMPLITUDE AND OFFSET; WALSH TRANSFORMS;

DATA CONVERSION, ANALOG TO DIGITAL;

EID: 0022768594     PISSN: 00984094     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCS.1986.1086004     Document Type: Article

References (7)

1. “Dynamic Performance Testing of A to D converters,” Hewlett Packard product note 5180A-2.
2. G. Pretzl, “A new approach for testing ultra fast A/D converters,” in ESSCIRC 77, Ulm, pp. 142–145.
3. —, “Dynamic testing of high speed aid converters,” IEEE J. Solid-State Circuits, vol. SC-13, pp. 368–371, 1978.
4. O. J. Downing and P. T. Johnson, “A method for the assessment of the performance of high speed analog/digital converters,” Electron. Lett., vol. 14, no. 8, pp. 238–240, Apr. 1978.
5. J. Doernber, H. Lee, and D. Hodges “Full speed testing of A/D converters,” IEEE J. Solid-State Circuits, vol. SC-19, pp. 820–827, Dec. 1984.
6. K. Beauchamp, Walsh Functions and Their Applications. London, England: Academic, 1975.
7. A. Papoulis, Probability Random Variables. New York: McGraw-Hill, 1974.