|
Volumn 248, Issue 2-3, 1986, Pages 367-378
|
Progress in semiconductor drift detectors
a b c c c d e e e e e f |
Author keywords
[No Author keywords available]
|
Indexed keywords
PARTICLE DETECTORS - TESTING;
POSITION MEASUREMENTS;
SEMICONDUCTOR DRIFT DETECTORS;
SEMICONDUCTOR COUNTERS;
|
EID: 0022767733
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/0168-9002(86)91021-1 Document Type: Article |
Times cited : (87)
|
References (9)
|