COMPREHENSIVE INTERFEROMETRIC CHARACTERIZATION OF RED AND NEAR-INFRARED EMISSIONS OF C, H, N, O, F, Cl, Br, I, P, S, AND Si IN A 370-W MICROWAVE-INDUCED HELIUM PLASMA.

Applied Spectroscopy

Volumn 40, Issue 6, 1986, Pages 766-772

  Pivonka, D E ^a   Schleisman, A J J ^a   Fateley, W G ^a   Fry, R C ^a  

^a KANSAS STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HYDROGEN - SPECTROSCOPIC ANALYSIS; NITROGEN - SPECTROSCOPIC ANALYSIS; OXYGEN - SPECTROSCOPIC ANALYSIS; PLASMAS - APPLICATIONS; SPECTROSCOPY, EMISSION - APPLICATIONS;

GROTRIAN DIAGRAM; INTERFEROMETRIC CHARACTERIZATION; MICROWAVE-INDUCED HELIUM PLASMA; NEAR-INFRARED EMISSIONS;

CARBON;

EID: 0022767021     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702864508340     Document Type: Article

References (9)