Variation in polarized light intensity with grain-orientation in anodized aluminum

Metallography

Volumn 19, Issue 3, 1986, Pages 345-357

  Saetre, T O ^a   Solberg, J K ^a   Ryum, N ^a  

^a NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM AND ALLOYS - ANODIC OXIDATION; CRYSTALS - ORIENTATION; LIGHT - POLARIZATION;

ANODIC ETCHING; ANODIC FILM OPTICAL PROPERTIES; ANODIZED ALUMINUM SPECIMENS; GRAIN ORIENTATION EFFECT;

ALUMINUM METALLOGRAPHY;

EID: 0022765668     PISSN: 00260800     EISSN: None     Source Type: Journal    
DOI: 10.1016/0026-0800(86)90022-4     Document Type: Article

References (12)

1. A new anodic-film method for studying orientation in aluminum
2. Revealing the grain structure of common aluminum alloy metallographic specimens
3. Sichtbarmachung der Korngefüges in Schliffproben von Aluminium durch anodische Oxydation
4. Zur struktur der anodischen deckschichten auf aluminiumoberflächen, I Mitteilung
5. Zur strukter der anodischen deckschichten auf aluminiumoberflächen, II Mitteilung
6. Electron microscopy of ion beam thinned porous anodic films formed on aluminum
7. Einsatzmöglichkeiten der elektronenmikroskopie auf dem gebiet anodisch erzeugter aluminiumoxidschichten
8. Optical Studies of Metal Surfaces
9. Grain boundary migration motivated by substructure in high purity metal crystals