|
Volumn 95, Issue 2, 1986, Pages 439-445
|
EXAFS investigations of TiS2 and CuxTiS2 single crystals (x = 0.35, 0.4)
a,b a,c a,b |
Author keywords
[No Author keywords available]
|
Indexed keywords
COPPER COMPOUNDS - X-RAY ANALYSIS;
BOND LENGTH;
EXTENDED X-RAY ABSORPTION FINE STRUCTURE (EXAFS);
INTERCALATION;
VAND DER WAALS GAP;
TITANIUM COMPOUNDS;
|
EID: 0022739541
PISSN: 00318965
EISSN: 1521396X
Source Type: Journal
DOI: 10.1002/pssa.2210950210 Document Type: Article |
Times cited : (5)
|
References (15)
|