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Volumn 22, Issue 3, 1987, Pages 460-463

A Four-State EEPROM Using Floating-Gate Memory Cells

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL MODELS;

EID: 0022738392     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/JSSC.1987.1052751     Document Type: Article
Times cited : (27)

References (6)
  • 1
    • 36849097956 scopus 로고
    • Fowler–Nordheim tunneling into thermally grown SiO2
    • M. Lenz linger and E. H. Snow, “Fowler–Nordheim tunneling into thermally grown SiO 2, ” J. Appl. Phys., vol. 40, no. 1, pp. 278–283, 1969.
    • (1969) J. Appl. Phys. , vol.40 , Issue.1 , pp. 278-283
    • linger, M.L.1    Snow, E.H.2
  • 2
    • 0016072040 scopus 로고
    • FAMOS—A new semiconductor charge storage device
    • D. Frohman-Bentchkowsky, FAMOS—A new semiconductor charge storage device,” Solid-State Electron., vol. SSE-17, pp. 517–529, 1974.
    • (1974) Solid-State Electron. , vol.SSE-17 , pp. 517-529
    • Frohman-Bentchkowsky, D.1
  • 3
    • 0020086733 scopus 로고
    • A thermionic electron emission model for charge retention in SAMOS structures
    • H. Nozawa and S. Kokyama, “A thermionic electron emission model for charge retention in SAMOS structures,” Japan. J. AppI. Phys., s, vol. 21, pp. L111–L112, 1982.
    • (1982) Japan. J. AppI. Phys. , vol.21 , pp. 1111-1112
    • Nozawa, H.1    Kokyama, S.2
  • 5
    • 0019696953 scopus 로고
    • Nonvolatile memories
    • D. Kahng, Ed. New York: Academic, Suppl. 2A
    • Y. Nishi and H. Iizuka, “Nonvolatile memories,” in. Applied Solid State Science, D. Kahng, Ed. New York: Academic, Suppl. 2A, 1981,. pp. 121–251.
    • (1981) Applied Solid State Science , pp. 121-251
    • Nishi, Y.1    Iizuka, H.2
  • 6
    • 0020190770 scopus 로고
    • A 16K. E2PROM employing new array architecture and designed-in reliability features
    • G. Yaron, S. J. Prasad, M. S. Ebel, and B. M. K. Leong, “A 16K. E2PROM employing new array architecture and designed-in reliability features,” IEEE J. Solid-State Circuits, vol. SC-17, pp. 833–840, 1982.
    • (1982) IEEE J. Solid-State Circuits , vol.SC-17 , pp. 833-840
    • Yaron, G.1    Prasad, S.J.2    Ebel, M.S.3    Leong, B.M.K.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.