ON YIELD, FAULT DISTRIBUTIONS, AND CLUSTERING OF PARTICLES.

IBM Journal of Research and Development

Volumn 30, Issue 3, 1986, Pages 326-338

  Stapper, C H ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

PROBABILITY; STATISTICAL METHODS;

CLUSTERING; FAULT DISTRIBUTIONS; MEMORY CHIPS; SEMICONDUCTOR WAFERS; WAFER-SCALE INTEGRATION;

INTEGRATED CIRCUITS, VLSI;

EID: 0022719974     PISSN: 00188646     EISSN: None     Source Type: Journal    
DOI: 10.1147/rd.303.0326     Document Type: Article

References (16)