CONDENSED LINEAR FEEDBACK SHIFT REGISTER (LFSR) TESTING - A PSEUDOEXHAUSTIVE TEST TECHNIQUE.

IEEE Transactions on Computers

Volumn C-35, Issue 4, 1986, Pages 367-370

  Wang, Laung Terng ^a   McCluskey, Edward J ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LOGIC CIRCUITS, COMBINATORIAL - TESTING; LOGIC DESIGN;

LINEAR FEEDBACK SHIFT REGISTERS; PSEUDOEXHAUSTIVE TESTING; TEST PATTERN GENERATION;

COMPUTERS, DIGITAL;

EID: 0022703128     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/tc.1986.1676772     Document Type: Article

References (16)