|
Volumn 7, Issue 4, 1986, Pages 214-218
|
An Efficient Algorithm for the Extraction of Parameters with High Confidence from Nonlinear Models
a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
INTEGRATED CIRCUITS - COMPUTER SIMULATION;
SEMICONDUCTOR DEVICES, FIELD EFFECT;
OPTIMAL PARAMETER EXTRACTION;
SCALABLE MOSFET MODEL;
SEMICONDUCTOR DEVICES, MOS;
|
EID: 0022701192
PISSN: 07413106
EISSN: 15580563
Source Type: Journal
DOI: 10.1109/EDL.1986.26350 Document Type: Article |
Times cited : (8)
|
References (5)
|