ACCUMULATOR COMPRESSION TESTING.

IEEE Transactions on Computers

Volumn C-35, Issue 4, 1986, Pages 317-321

  Saxena, Nirmal R ^a   Robinson, John P ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT TESTING; INTEGRATED CIRCUITS, VLSI - TESTING;

ACCUMULATOR COMPRESSION TESTING (ACT); SIGNATURE TESTING; SYNDROME TESTING;

LOGIC CIRCUITS;

EID: 0022700735     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.1986.1676764     Document Type: Article

References (18)

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