|
Volumn 94, Issue 1, 1986, Pages 71-76
|
Reactions at the Ti/SiO2 Interface Studied by EELS
a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
TITANIUM AND ALLOYS - SPECTROSCOPIC ANALYSIS;
BOND ANGLE;
EELS;
LOSS SPECTRUM;
SILICON COMPOUNDS;
|
EID: 0022675490
PISSN: 00318965
EISSN: 1521396X
Source Type: Journal
DOI: 10.1002/pssa.2210940107 Document Type: Article |
Times cited : (5)
|
References (17)
|