ELECTRO-OPTIC SAMPLING: TESTING PICOSECOND ELECTRONICS; PART 1. PRINCIPLES AND EMBODIMENTS.

Laser Focus (Littleton, Massachusetts)

Volumn 22, Issue 2, 1986, Pages

  Valdmanis, J A ^a   Mourou, G ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROOPTICAL DEVICES - TESTING; LASER PULSES;

ELECTRO-OPTIC SAMPLING; PICOSECOND ELECTRONICS; SHORT-PULSE LASER; TEMPORAL RESOLUTION;

SAMPLING;

EID: 0022671476     PISSN: 07402511     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (33)