RECOMBINATION CENTERS, CARRIER LIFETIME AND ELECTRICAL CHARACTERISTICS IN ELECTRON IRRADIATED POWER SEMICONDUCTOR DEVICES.

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Volumn 55, Issue 1, 1986, Pages 47-55

  Fuochi, Piergiorgio ^a   Di Marco, Piergiulio ^a   Bisio, Giacomo M ^a   Di Zitti, Ermanno ^a   Passerini, Bruno V ^a   Tenconi, Sandro ^a   Zambelli, Mauro ^a  

^a CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS;

CARRIER LIFETIME; ELECTRICAL CHARACTERISTICS; IRRADIATED POWER SEMICONDUCTOR DEVICES; RECOMBINATION CENTERS;

SEMICONDUCTOR DEVICES;

EID: 0022605209     PISSN: 00026557     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (22)