An Efficient and Reliable Approach for Semiconductor Device Parameter Extraction

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 5, Issue 1, 1986, Pages 170-179

  Wang, Shui Jinn ^a   Lee, Jau Yien ^a   Chang, Chun Yen ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL TECHNIQUES - ITERATIVE METHODS; SEMICONDUCTOR DEVICES - COMPUTER AIDED DESIGN;

NONLINEAR OBJECTIVE FUNCTION MINIMIZATION; PARAMETER EXTRACTION;

INTEGRATED CIRCUITS;

EID: 0022582184     PISSN: 02780070     EISSN: 19374151     Source Type: Journal    
DOI: 10.1109/TCAD.1986.1270184     Document Type: Article

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