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Volumn 141, Issue 3, 1986, Pages 385-391

Cryoprotection in electron microscopy
[No Author Info available]

Author keywords

critical dose; cryoprotection; electron diffraction; high resolution; liquid helium temperature; liquid nitrogen temperature; low temperature; low dose imaging; paraffin; purple membrane; Radiation damage

Indexed keywords

CRYOPROTECTION; ELECTRON MICROSCOPY; NONHUMAN; RADIATION INJURY; TEMPERATURE SENSITIVITY; THEORETICAL STUDY;

EID: 0022578580     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.1986.tb02731.x     Document Type: Article
Times cited : (66)

References (25)
  • 4
    • 0021066823 scopus 로고
    • Temperature dependence of the critical electron exposure for hydrocarbon monolayers
    • (1983) Ultramicroscopy , vol.11 , pp. 229-238
    • Downing, K.H.1
  • 9
    • 84985244609 scopus 로고
    • Radiation damage of 1‐valine between 8 and 300 K. Proceedings, Tenth International Congress on Electron Microscopy, Hamburg, Vol. 2, pp., 457, 456
    • (1982)
    • Heide, H.G.1    Hermann, K.‐H.2    Jager, J.3
  • 17
    • 0020206475 scopus 로고
    • Interpretation of the fading of diffraction patterns from organic substances irradiated with 100 keV electrons at 10–300 K
    • (1982) Ultramicroscopy , vol.10 , pp. 199-210
    • Reimer, L.1    Spruth, J.2
  • 22
    • 0020872798 scopus 로고
    • The temperature dependence of radiation damage in organic and biological materials
    • (1984) Ultramicroscopy , vol.14 , pp. 265-270
    • Wade, R.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.