RESULTS FROM APPLICATION OF A COMMERCIAL ATG SYSTEM TO LARGE-SCALE COMBINATIONAL CIRCUITS.

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn , Issue , 1985, Pages 667-670

  Rosales, Barry C ^a   Goel, Prabhu ^a  

^a Littleton MA USA ^*

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS, VLSI - AUTOMATIC TESTING;

AIDSTG SYSTEM; AUTOMATIC TEST GENERATION SYSTEM; LARGE-SCALE COMBINATIONAL CIRCUITS; MOS CIRCUITS; TEST VECTOR GENERATION;

LOGIC CIRCUITS, COMBINATORIAL;

EID: 0022329675     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)