ERROR LATENCY OF DELAY FAULTS IN COMBINATIONAL AND SEQUENTIAL CIRCUITS.

Digest of Papers - International Test Conference

Volumn , Issue , 1985, Pages 334-341

  Wagner, K D ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LOGIC CIRCUITS, SEQUENTIAL - TESTING;

DELAY ERROR LATENCY; LOGIC CIRCUIT FAULT DIAGNOSIS; MARKOV MODELS; SEQUENTIAL LOGIC CIRCUIT FAULT DIAGNOSIS;

LOGIC CIRCUITS, COMBINATORIAL;

EID: 0022324841     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)