PROSPECTS OF SST TECHNOLOGY FOR HIGH-SPEED LSI.

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1985, Pages 18-21

  Sakai, Tetsushi ^a   Konaka, Shinsuke ^a   Yamamoto, Yousuke ^a   Suzuki, Masao ^a  

^a NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE, SEMICONDUCTOR;

BIPOLAR INTEGRATED CIRCUITS; RANDOM-ACCESS MEMORIES; SUPER SELFALIGNED PROCESS TECHNOLOGY (SST); VERY HIGH-SPEED INTEGRATED CIRCUITS;

INTEGRATED CIRCUITS, LSI;

EID: 0022315668     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iedm.1985.190880     Document Type: Conference Paper

References (8)