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Volumn , Issue , 1985, Pages 922-929
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VLSI FUNCTIONAL TEST PATTERN GENERATION - A DESIGN AND IMPLEMENTATION.
a
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Author keywords
[No Author keywords available]
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Indexed keywords
INTEGRATED CIRCUITS, VLSI;
FAULT MODELING;
INTEGRATED-CIRCUIT DESIGN;
TEST PATTERN GENERATION;
VERY LARGE-SCALE INTEGRATION;
INTEGRATED CIRCUIT TESTING;
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EID: 0022313921
PISSN: 07431686
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (4)
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References (9)
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