AUTOMATIC DESIGN OF EXHAUSTIVELY SELF-TESTING CHIPS WITH BILBO MODULES.

Digest of Papers - International Test Conference

Volumn , Issue , 1985, Pages 362-371

  Krasniewski, Andrzej ^a   Albicki, Alexander ^a  

^a UNIVERSITY OF ROCHESTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LOGIC DESIGN;

BILBO MODULES; BUILT-IN SELF-TEST; LOGIC TESTING; SELF-TESTING;

LOGIC CIRCUITS;

EID: 0022307227     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)