PSEUDO-EXHAUSTIVE ADJACENCY TESTING: A BIST APPROACH FOR STUCK-OPEN FAULTS.

Digest of Papers - International Test Conference

Volumn , Issue , 1985, Pages 126-137

  Craig, Gary L ^a   Kime, Charles R ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICES, MOS;

BIST; BUILT-IN SELF-TESTS; CMOS INTEGRATED CIRCUITS; SELF-TESTING; STUCK-OPEN FAULTS;

INTEGRATED CIRCUIT TESTING;

EID: 0022306482     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (26)