BAND-OVERLAP METALLIZATION OF BaTe AND BaSe.

Volumn , Issue , 1985, Pages 69-74

  Ruoff, Arthur L ^a   Grzybowski, Thomas A ^a  

^a Department of Obstetrics Gynecology

Author keywords

[No Author keywords available]

Indexed keywords

SELENIUM COMPOUNDS - X-RAY ANALYSIS; TELLURIUM COMPOUNDS - X-RAY ANALYSIS; X-RAY ANALYSIS - APPLICATIONS; X-RAYS - DIFFRACTION;

ABSORPTION EDGE MEASUREMENTS; BAND-OVERLAP METALLIZATION; ENERGY DISPERSIVE X-RAY DIFFRACTION; LATTICE PARAMETER MEASUREMENTS; RESISTANCE STUDIES;

BARIUM COMPOUNDS;

EID: 0022282493     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)