DEFECT PRODUCTION IN SiO//2 BY X-RAY AND Co-60 RADIATIONS.

IEEE Transactions on Nuclear Science

Volumn NS-32, Issue 6, 1985, Pages

  Dozier, C M ^a   Brown, D B ^a   Throckmorton, J L ^a   Ma, D I ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS - RADIATION EFFECTS; SEMICONDUCTOR DEVICES - SEMICONDUCTOR INSULATOR BOUNDARIES; TRANSISTORS, FIELD EFFECT;

COBALT-60 SOURCES;

SILICON COMPOUNDS;

EID: 0022247785     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (21)