ON THE USE OF LINEAR SUMS IN EXHAUSTIVE TESTING.

Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)

Volumn , Issue , 1985, Pages 148-153

  Akers, Sheldon B ^a  

^a GENERAL ELECTRIC COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS, DIGITAL;

COMBINATORIAL CIRCUITS; LINEAR SUMS OF TEST SIGNALS; UNIVERSAL TEST SETS;

INTEGRATED CIRCUITS, VLSI;

EID: 0022246975     PISSN: 07313071     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)