WAFER LEVEL ELECTROMIGRATION TESTS FOR PRODUCTION MONITORING.

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1985, Pages 100-107

  Root, Bryan J ^a   Turner, Tim ^a  

^a STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM AND ALLOYS; FAILURE ANALYSIS; STRESSES;

ELECTROMIGRATION;

SEMICONDUCTOR MATERIALS;

EID: 0022246522     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)