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Volumn 32, Issue 6, 1985, Pages 3899-3904

The time dependence of interface state production

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL REACTIONS - REACTION KINETICS; HYDROGEN; RADIATION EFFECTS;

EID: 0022231767     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1985.4334040     Document Type: Article
Times cited : (32)

References (15)
  • 15
    • 0022241790 scopus 로고
    • Total Dose Induced Hole Trapping and Interface State Generation in Bipolar Recessed Field Oxides
    • Monterey. July
    • R.L. Pease, H.E. Boesch, Jr. and D. Emily, “Total Dose Induced Hole Trapping and Interface State Generation in Bipolar Recessed Field Oxides,” 1985 IEEE Nuclear and Space Radiation Effects Conf.- Monterey. July 22–24.
    • (1985) EEE Nuclear and Space Radiation Effects Conf , pp. 22-24
    • Pease, R.L.1    Boesch, H.E.2    Emily, D.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.