INFLUENCE OF STRESS ON ALUMINUM CONDUCTOR LIFE.

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1985, Pages 142-147

  Turner, T ^a   Wendel, K ^a  

^a STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS - RELIABILITY; METALLIZING - FAILURE; STRESSES;

ELECTROMIGRATION; NABARRO-HERRING CREEP;

ALUMINUM AND ALLOYS;

EID: 0022228065     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/irps.1985.362089     Document Type: Conference Paper

References (6)