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Volumn 23, Issue 2, 1985, Pages 263-271
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Electron-microprobe analysis of minerals for rare-earth elements: use of calculated peak-overlap corrections.
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0022217753
PISSN: 00084476
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (78)
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References (0)
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