METHODOLOGY FOR THE CALCULATION OF CONTINUOUS dc ELECTROMIGRATION EQUIVALENTS FROM TRANSIENT CURRENT WAVEFORMS.

Proceedings - The Electrochemical Society

Volumn 85-6, Issue , 1985, Pages 64-74

  McPherson, J W ^a   Ghate, P B ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS PACKAGING; FAILURE ANALYSIS; METALLIZING; WAVEFORM ANALYSIS;

CONTINUOUS DC ELECTROMIGRATION EQUIVALENTS; ELECTROMIGRATION; FAILURE RATE; TRANSIENT CURRENT WAVEFORMS;

INTEGRATED CIRCUITS, VLSI;

EID: 0022208137     PISSN: 01616374     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)