STUDY OF SINGLE EVENTS IN GaAs SRAMS.

IEEE Transactions on Nuclear Science

Volumn NS-32, Issue 6, 1985, Pages

  Weatherford, T R ^a   Hauser, J R ^a   Diehl Nagle, S E ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE, DIGITAL - RANDOM ACCESS; SEMICONDUCTING GALLIUM ARSENIDE; TRANSISTORS, FIELD EFFECT;

SINGLE EVENT UPSET;

INTEGRATED CIRCUITS;

EID: 0022205836     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (15)