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Volumn NS-32, Issue 6, 1985, Pages
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LOW FLUX LABORATORY TEST OF THE INTERNAL DISCHARGE MONITOR (IDM) EXPERIMENT INTENDED FOR CRRES.
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRONS;
SATELLITES - ELECTRONIC EQUIPMENT;
EXTRATERRESTRIAL RADIATION EFFECTS;
PRINTED CIRCUITS;
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EID: 0022204733
PISSN: 00189499
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (12)
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References (5)
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