Inductive Fault Analysis of MOS Integrated Circuits

IEEE Design and Test of Computers

Volumn 2, Issue 6, 1985, Pages 13-26

  Shen, John P ^a   Maly, W ^a   Joel Ferguson, F ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT-LEVEL FAULT EXTRACTION; CLASSIFICATION AND RANKING OF FAULT TYPES; INDUCTIVE FAULT ANALYSIS (IFA); NONCLASSICAL FAULTS; PHYSICAL DEFECT GENERATION;

SEMICONDUCTOR DEVICES, MOS - ANALYSIS;

INTEGRATED CIRCUITS;

EID: 0022201294     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/MDT.1985.294793     Document Type: Article

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