ION TRACK SHUNT EFFECTS IN MULTI-JUNCTION STRUCTURES.

IEEE Transactions on Nuclear Science

Volumn NS-32, Issue 6, 1985, Pages

  Hauser, J R ^a   Diehl Nagle, S E ^a   Knudson, A R ^a   Campbell, A B ^a   Stapor, W J ^a   Shapiro, P ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICES, MOS - JUNCTIONS;

CMOS TECHNOLOGY; HEAVY IONS; RADIATION HARDENING; SHUNT EFFECTS;

TRANSISTORS, BIPOLAR;

EID: 0022188818     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (10)