EFFECT OF SUPPLY VOLTAGE ON CIRCUIT PROPAGATION DELAY AND TEST APPLICATIONS.

Volumn , Issue , 1985, Pages 42-44

  Wagner, K D ^a   McCluskey, E J ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PROPAGATION DELAY;

INTEGRATED CIRCUIT TESTING;

EID: 0022187644     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)