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Volumn 32, Issue 11, 1985, Pages 2383-2391

A Small Signal dc-to-High-Frequency Nonquasistatic Model for the Four-Terminal MOSFET Valid in All Regions of Operation

Author keywords

[No Author keywords available]

Indexed keywords

TRANSISTORS, FIELD EFFECT - MATHEMATICAL MODELS;

EID: 0022152815     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1985.22284     Document Type: Article
Times cited : (98)

References (28)
  • 1
    • 0015025121 scopus 로고
    • MOS models and circuit simulation
    • Mar.
    • J. E. Meyer, “MOS models and circuit simulation,” RCA Rev., vol. 32, pp. 42–63, Mar. 1971.
    • (1971) RCA Rev. , vol.32 , pp. 42-63
    • Meyer, J.E.1
  • 2
    • 0018027059 scopus 로고
    • A charge-oriented model for MOS transistor capacitances
    • Oct.
    • D. E. Ward and R. W. Dutton, “A charge-oriented model for MOS transistor capacitances,” IEEE J. Solid-State Circuits, vol. SC-13, pp. 703–708, Oct. 1978.
    • (1978) IEEE J. Solid-State Circuits , vol.SC-13 , pp. 703-708
    • Ward, D.E.1    Dutton, R.W.2
  • 3
    • 0020834178 scopus 로고
    • On the small-signal behavior of MOS transistor in quasistatic operation
    • C. Turchetti, G. Masetti, and Y. Tsividis, “On the small-signal behavior of MOS transistor in quasistatic operation,” Solid-State Electron., vol. 26, no. 10, pp. 941–949, 1983.
    • (1983) Solid-State Electron. , vol.26 , Issue.10 , pp. 941-949
    • Turchetti, C.1    Masetti, G.2    Tsividis, Y.3
  • 4
    • 84915135058 scopus 로고
    • A small-signal high-frequency analysis of the insulated-gate field-effect transistor
    • Aug.
    • D. B. Candler and A. G. Jordan, “A small-signal high-frequency analysis of the insulated-gate field-effect transistor,” Int. J. Electron., vol. 19, pp. 181–196, Aug. 1965.
    • (1965) Int. J. Electron. , vol.19 , pp. 181-196
    • Candler, D.B.1    Jordan, A.G.2
  • 5
    • 50549200962 scopus 로고
    • Calculation of high-frequency characterisitcs of thin-film transistors
    • Jan.
    • J. A. Geurst, “Calculation of high-frequency characterisitcs of thin-film transistors,” Solid-State Electron., vol. 8, pp. 88–90, Jan. 1965.
    • (1965) Solid-State Electron. , vol.8 , pp. 88-90
    • Geurst, J.A.1
  • 6
    • 0006398682 scopus 로고
    • High-frequency characteristics of the insulated-gate field-effect transistors
    • Sep.
    • J. R. Burns, “High-frequency characteristics of the insulated-gate field-effect transistors,” RCA Rev., vol. 28, pp. 385–418, Sep. 1967.
    • (1967) RCA Rev. , vol.28 , pp. 385-418
    • Burns, J.R.1
  • 7
    • 0342340146 scopus 로고
    • Small-signal, high-frequency equivalent circuit for the metal-oxide-semiconductor field-effect transistor
    • May
    • J. W. Haslett and F. N. Trofimenkoff, “Small-signal, high-frequency equivalent circuit for the metal-oxide-semiconductor field-effect transistor,” Proc. IEE, vol. 116, pp. 699–702, May 1969.
    • (1969) Proc. IEE , vol.116 , pp. 699-702
    • Haslett, J.W.1    Trofimenkoff, F.N.2
  • 8
    • 11644250622 scopus 로고
    • A simple and accurate approximation to the high-frequency characteristics of insulated-gate field-effect transistors
    • J. A. Van Nielen, “A simple and accurate approximation to the high-frequency characteristics of insulated-gate field-effect transistors,” Solid-State Electron., vol. 12, pp. 826–829, 1969.
    • (1969) Solid-State Electron. , vol.12 , pp. 826-829
    • Van Nielen, J.A.1
  • 9
    • 0014628480 scopus 로고
    • High-frequency network properties of MOS transistors including the substrate resistivity effects
    • Dec.
    • M. B. Das, “High-frequency network properties of MOS transistors including the substrate resistivity effects,” IEEE Trans. Electron Devices, vol. ED-16, pp. 1049–1069, Dec. 1969.
    • (1969) IEEE Trans. Electron Devices , vol.ED-16 , pp. 1049-1069
    • Das, M.B.1
  • 10
    • 0015145569 scopus 로고
    • Frequency and transient characteristics of metal-oxide-semiconductor transistors and synthesis of their equivalent circuits
    • M. V. Balakirev and V. M. Bogachev, “Frequency and transient characteristics of metal-oxide-semiconductor transistors and synthesis of their equivalent circuits,” Radio Eng. Electron. Phys. (USSR), pp. 1884–1894, 1971.
    • (1971) Radio Eng. Electron. Phys. (USSR) , pp. 1884-1894
    • Balakirev, M.V.1    Bogachev, V.M.2
  • 11
    • 0020780738 scopus 로고
    • Limitations of quasi-static capacitance models for the MOS transistor
    • July.
    • J. J. Paulos and D. A. Antoniadis, “Limitations of quasi-static capacitance models for the MOS transistor,” IEEE Electron Device Lett., vol. EDL-4, no. 7, July 1983.
    • (1983) IEEE Electron Device Lett. , vol.EDL-4 , Issue.7
    • Paulos, J.J.1    Antoniadis, D.A.2
  • 12
    • 0020207780 scopus 로고
    • Moderate inversion in MOS devices
    • also see Erratum, Solid-State Electron., vol. 26, no. 8, p. 823, 1983
    • Y. Tsividis, “Moderate inversion in MOS devices,” Solid-State Electron., vol. 25, no. 11, pp. 1099–1104, 1982; also see “Erratum,” Solid-State Electron., vol. 26, no. 8, p. 823, 1983.
    • (1982) Solid-State Electron. , vol.25 , Issue.11 , pp. 1099-1104
    • Tsividis, Y.1
  • 14
    • 0017932965 scopus 로고
    • A charge-sheet model of the MOSFET
    • J. R. Brews, “A charge-sheet model of the MOSFET,” Solid-State Electron., vol. 21, pp. 345–355, 1978.
    • (1978) Solid-State Electron. , vol.21 , pp. 345-355
    • Brews, J.R.1
  • 15
    • 0017942903 scopus 로고
    • Analytical i.g.f.e.t. model including drift and diifusion
    • Mar.
    • G. Baccarani, M. Rudan, and G. Sapdini, “Analytical i.g.f.e.t. model including drift and diifusion,” IEE J. Solid-State Electron. Dev., vol. 2, pp. 62–68, Mar. 1978.
    • (1978) IEE J. Solid-State Electron. Dev. , vol.2 , pp. 62-68
    • Baccarani, G.1    Rudan, M.2    Sapdini, G.3
  • 16
    • 0018754251 scopus 로고
    • A long-channel MOSFET model
    • F. Van de Wiele, “A long-channel MOSFET model,” Solid-State Electron., vol. 22, pp. 991–997, 1979.
    • (1979) Solid-State Electron. , vol.22 , pp. 991-997
    • Van de Wiele, F.1
  • 17
    • 0015346472 scopus 로고
    • An accurate large-signal MOS transistor model for use in computer-aided design
    • May
    • G. Merckel, J. Borel, and N. Z. Cupcea, “An accurate large-signal MOS transistor model for use in computer-aided design,” IEEE Trans. Electron Devices, vol. ED-19, no. 5, pp. 681–690, May 1972.
    • (1972) IEEE Trans. Electron Devices , vol.ED-19 , Issue.5 , pp. 681-690
    • Merckel, G.1    Borel, J.2    Cupcea, N.Z.3
  • 18
    • 84941515163 scopus 로고
    • MOS device modeling
    • Y. Tsividis and P. Antognetti, Eds. Englewood Cliffs, NJ: Prentice-Hall
    • F. M. Klaassen, “MOS device modeling,” in Design of MOS VLSI Circuits for Telecommunications, Y. Tsividis and P. Antognetti, Eds. Englewood Cliffs, NJ: Prentice-Hall, 1985.
    • (1985) Design of MOS VLSI Circuits for Telecommunications
    • Klaassen, F.M.1
  • 19
    • 84941504175 scopus 로고
    • Vth and beyond
    • presented at the Workshop on Device Modeling for VLSI, Burlingame, CA, Mar. 29
    • H. C. Poon, “Vth and beyond,” presented at the Workshop on Device Modeling for VLSI, Burlingame, CA, Mar. 29, 1979.
    • (1979)
    • Poon, H.C.1
  • 20
    • 84941505369 scopus 로고
    • New York: McGraw-Hill, to be publish
    • Y. Tsividis, The MOS Transistor. New York: McGraw-Hill, 1986, to be published.
    • (1986) The MOS Transistor.
    • Tsividis, Y.1
  • 21
    • 0021197310 scopus 로고
    • Problems in precision modeling of the MOS transistor for analog applications
    • Jan.
    • Y. Tsividis and G. Masetti, “Problems in precision modeling of the MOS transistor for analog applications,” IEEE Trans. Computer-Aided Design of ICAS, vol. CAD-3, pp. 72–79, Jan. 1984.
    • (1984) IEEE Trans. Computer-Aided Design of ICAS , vol.CAD-3 , pp. 72-79
    • Tsividis, Y.1    Masetti, G.2
  • 22
    • 0019009663 scopus 로고
    • The method for determination of small-signal admittance matrix of the RC transmission line with voltage-controlled parameters
    • Apr.
    • T. Kacprzak, “The method for determination of small-signal admittance matrix of the RC transmission line with voltage-controlled parameters,” IEEE Trans. Circuits Syst., vol. CAS-27, no. 4, Apr. 1980.
    • (1980) IEEE Trans. Circuits Syst. , vol.CAS-27 , Issue.4
    • Kacprzak, T.1
  • 23
    • 0003751444 scopus 로고
    • Charge-based modeling of capacitances in MOS transistors
    • Integrated Circuits Lab., Stanford Univ., Tech. Rep. G201-11, June
    • D. E. Ward, “Charge-based modeling of capacitances in MOS transistors,” Integrated Circuits Lab., Stanford Univ., Tech. Rep. G201-11, June 1981.
    • (1981)
    • Ward, D.E.1
  • 24
    • 0019019746 scopus 로고
    • Relations between incremental intrinsic capacitances and transconductances in MOS transistors
    • May
    • Y. Tsividis, “Relations between incremental intrinsic capacitances and transconductances in MOS transistors,” IEEE Trans. Electron Devices, vol. ED-27, pp. 946–948, May 1980.
    • (1980) IEEE Trans. Electron Devices , vol.ED-27 , pp. 946-948
    • Tsividis, Y.1
  • 25
    • 84939004549 scopus 로고
    • Measurement and modeling of small-geometry MOS transistor capacitances
    • Ph.D. dissertation, Massachusetts Institute of Technology, Sept.
    • J. J. Paulos, “Measurement and modeling of small-geometry MOS transistor capacitances,” Ph.D. dissertation, Massachusetts Institute of Technology, Sept. 1984.
    • (1984)
    • Paulos, J.J.1
  • 26
    • 0019668572 scopus 로고
    • A charge sheet model for small geometry MOSFET's
    • P. P. Guebels and F. Van de Wiele, “A charge sheet model for small geometry MOSFET's,” in IEDM Tech. Dig., pp. 211–214, 1981.
    • (1981) IEDM Tech. Dig. , pp. 211-214
    • Guebels, P.P.1    Van de Wiele, F.2
  • 28
    • 0021407842 scopus 로고
    • A CAD-oriented analytical MOSFET model for high-accuracy applications
    • C. Turchetti and G. Masetti, “A CAD-oriented analytical MOSFET model for high-accuracy applications,” IEEE Trans. Computer-Aided Design of ICAS, vol. CAD-3, 1984.
    • (1984) IEEE Trans. Computer-Aided Design of ICAS , vol.CAD-3
    • Turchetti, C.1    Masetti, G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.