On the Implementation of an Analog ATPG: The Linear Case

IEEE Transactions on Instrumentation and Measurement

Volumn 34, Issue 3, 1985, Pages 442-449

  Wey, Chin Long ^a   Saeks, Richard ^b  

^a MICHIGAN STATE UNIVERSITY   (United States)

^b ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS, LINEAR - COMPONENTS; MATHEMATICAL TECHNIQUES - ALGORITHMS;

ANALOG ATPG; AUTOMATIC TEST PROGRAM GENERATION (ATPG); AVAILABLE TEST POINTS; SELF-TESTING ALGORITHMS; SIMULTANEOUS FAILURES;

AUTOMATIC TESTING;

EID: 0022120563     PISSN: 00189456     EISSN: 15579662     Source Type: Journal    
DOI: 10.1109/TIM.1985.4315366     Document Type: Article

References (11)

1. T. Amin, Bell Laboratories, unpublished notes, 1980.
2. R. DeCarlo and R. Saeks, Interconnected Dynamical Systems. New York: Marcel Dekker, 1981.
3. S. L. Hakimi, “Fault analysis in digital system-A graph theoretic approach,” in Rational Fault Analysis, R. Saeks and S. R. Liberty, Eds. New York: Marcel Dekker, 1977, pp. 1–12.
4. D. Holder, M.S. thesis, Texas Tech Univ., Lubbock, TX, in preparation.
5. R.-W. Liu, Univ. of Notre Dame, Notre Dame, IN, 1980, unpublished notes.
6. R.-W. Liu and R. Saeks, Eds., Rep. on the ONR Workshop on Analog Fault Diagnosis, Univ. of Notre Dame, Notre Dame, IN, May 1981.
7. F. P. Preparata, G. Metze, and R. T. Chien, “On the connection assignment problem of diagnosible systems,” IEEE Trans. Electron. Comput., vol. EC-16, pp. 448–454, 1967.
8. R. Saeks, “Criteria for analog fault diagnosis,” in Nonlinear Fault Analysis, Texas Tech Univ., Lubbock, TX, pp. 19–28.
9. C. L. Wey, AATPG -Linear Circuit Version, User Manual, Texas Tech Univ., Lubbock, TX, 1982.
10. —, Ph.D. dissertation, Texas Tech Univ., Lubbock, TX, in preparation.
11. C.-C. Wu, K. Nakajima, C. L. Wey, and R. Saeks, “Analog fault diagnosis with failure bounds,” IEEE Trans. Circuits Syst., vol. CAS-29, pp. 277–284, May 1982.