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Volumn 132, Issue 8, 1985, Pages 1903-1908

Acceleration factors for thin oxide breakdown

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS - THIN FILMS; ELECTRIC BREAKDOWN;

EID: 0022107573     PISSN: 00134651     EISSN: 19457111     Source Type: Journal    
DOI: 10.1149/1.2114251     Document Type: Article
Times cited : (74)

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