Absolute Soft X-Ray Measurements with a Transmission Grating Spectrometer

Laser and Particle Beams

Volumn 4, Issue 3-4, 1986, Pages 521-530

  Mizuit, J ^c   Herrmann, P ^a   Pakula, R ^a   Sigel, R ^a   Witkowski, S ^a  

^a MAX PLANCK INSTITUT FÜR QUANTENOPTIK   (Germany)

^b SIEMENS AG   (Germany)

^c IPP Nagoya ^*  (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BOLOMETERS; OPTICAL GRATINGS; SPECTROSCOPY, X-RAY; X-RAY FILMS - CALIBRATION; X-RAYS;

SOFT X-RAY EMISSION; SPACE-RESOLVED SPECTROSCOPY; TRANSMISSION GRATING SPECTROMETER;

PLASMAS;

EID: 0022105961     PISSN: 02630346     EISSN: 1469803X     Source Type: Journal    
DOI: 10.1017/S0263034600002202     Document Type: Article

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