RANDOM FUSE MODEL FOR BREAKING PROCESSES.

Journal de physique. Lettres

Volumn 46, Issue 13, 1985, Pages 585-590

  de Arcangelis, L ^a   Redner, S ^a  

^a BOSTON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORKS - ANALYSIS;

BREAKING PROCESSES; CURRENT CARRYING PROPERTY; RANDOM FUSE MODEL;

ELECTRIC BREAKDOWN;

EID: 0022101641     PISSN: 0302072X     EISSN: None     Source Type: Journal    
DOI: 10.1051/jphyslet:019850046013058500     Document Type: Article

References (19)