Identifying Error-Prone Software—An Empirical Study

IEEE Transactions on Software Engineering

Volumn SE-11, Issue 4, 1985, Pages 317-324

  Shen, Vincent Y ^a   Yu, Tze Jie ^a   Thebaut, Stephen M ^b   Paulsen, Lorri R ^c  

^a PURDUE UNIVERSITY   (United States)

^b UNIVERSITY OF FLORIDA   (United States)

^c IBM   (United States)

Author keywords

Defect density; error prone modules; probability of errors; programa testing; software errors; software metrics

Indexed keywords

COMPUTER SYSTEMS PROGRAMMING - FAILURE; MATHEMATICAL TECHNIQUES - ERROR ANALYSIS;

DEFECT DENSITY; DEVELOPMENT VERIFICATION TEST (DVT); ERROR-PRONE MODULES; PROGRAM TROUBLE MEMORANDUM (PTM); SOFTWARE METRICS;

COMPUTER SOFTWARE;

EID: 0022044747     PISSN: 00985589     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSE.1985.232222     Document Type: Article

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